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The root cause of many material failures often has a particulate basis. Examples include contaminants in the manufacturing process, heterogeneous distribution of alloying inclusions, environmental effects and mechanical defects. Our staff scientists use state-of-the-art instruments and techniques to provide you reliable, confidential failure analysis results.
Key Services
Optical Analysis
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Chemical Analysis
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Common Failure-Related Problems
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Related Techniques & Instrumentation
- Fourier Transform Infrared Spectroscopy (FTIR)
- X-Ray Photo-Electron Spectroscopy (XPS)
- Photography
- Raman Microspectroscopy
- Sample Preparation
- Scanning Electron Microscopy (SEM)
- Secondary Ion Mass Spectrometry (SIMS)
- Transmission Electron Microscopy (TEM)
- X-Ray Diffraction (XRD)
- X-Ray Spectroscopy (EDS and WDS)
| Attachment | Size |
|---|---|
| Failure Analysis Information Sheet | 1.3 MB |