X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a surface analysis technique that uses photoelectrons generated by an x-ray beam to analyze the composition and chemistry of the outermost ~5 nm of the surfaces of solid samples.

Using XPS, we can determine the quantitative elemental composition of surfaces, molecular species present on surfaces, and chemical states of surface atoms.

Instrumentation:

McCrone Associates uses a Physical Electronics Quantum 2000 Scanning ESCA Microprobe, a dedicated XPS system with many advanced features, including:

• Sample sizes to 75 mm square
• Unequivocal sample and feature location through the use of a stand-alone sample positioning station (SPS)
• Small spot capability—with analysis of features and particles as small as 5 µm, and elemental and chemical state mapping
• High-resolution spectra from a monochromatic x-ray source
• Automated ion beam sputtering for depth profiling
• Total system automation for unattended operation
• Off-line data processing for increased productivity